Spectroscopic ellipsometry characterization of ZrO2 thin...

Spectroscopic ellipsometry characterization of ZrO2 thin films by nitrogen-assisted reactive magnetron sputtering

L.Q. Zhu, Q. Fang, G. He, M. Liu, X.X. Xu, L.D. Zhang
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Volume:
9
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.mssp.2006.10.019
File:
PDF, 195 KB
english, 2006
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