Determination of Diffusion Length for the Finite Thickness...

IEEE Transactions on Electron Devices 2013 / 10 Vol. 60; Iss. 10

Determination of Diffusion Length for the Finite Thickness Normal-Collector Configuration Using EBIC Technique

Tan, Chee Chin, Ong, Vincent K. S., Radhakrishnan, K., Sunar, Siti Hairunnisah Bte
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2277584
Date:
October, 2013
File:
PDF, 1.41 MB
english, 2013
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