Analysis of Time Dependent Electric Field Degradation in...

IEEE Transactions on Electron Devices 2014 / 9 Vol. 61; Iss. 9

Analysis of Time Dependent Electric Field Degradation in AlGaN/GaN HEMTs

Hodge, Michael D., Heller, Eric R., Vetury, Ramakrishna, Shealy, Jeffrey B.
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2336248
Date:
September, 2014
File:
PDF, 2.49 MB
english, 2014
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