IP for embedded diagnosis

IEEE Design & Test of Computers 2002 / 05 Vol. 19; Iss. 3

IP for embedded diagnosis

Pateras, S.
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Volume:
19
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2002.1003795
Date:
May, 2002
File:
PDF, 327 KB
english, 2002
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