Volume 19; Issue 3

IEEE Design & Test of Computers

Volume 19; Issue 3
1

Survey of low-power testing of VLSI circuits

Girard, P.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 262 KB
english, 2002
2

Design and test education in Latin America

Liu, Deli, Sun, Dezhi, Li, Yangqing
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 312 KB
english, 2002
3

Embedded robustness IPs for transient-error-free ICs

Dupont, E., Nicolaidis, M., Rohr, P.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 295 KB
english, 2002
4

A strategy for mixed-signal yield improvement

Bordelon, J., Tranchina, B., Madangarli, V., Craig, M.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 334 KB
english, 2002
5

IP for embedded diagnosis

Pateras, S.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 327 KB
english, 2002
6

ETM10 incorporates hardware segment of IEEE P1500

McLaurin, T., Ghosh, S.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 246 KB
english, 2002
7

Toward CAD-IP reuse: a web bookshelf of fundamental algorithms

Caldwell, A.E., Markov, I.L., Kahng, A.B.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 254 KB
english, 2002
8

Embedded timing analysis: a soc infrastructure

Tabatabaei, S., Ivanov, A.
Journal:
IEEE Design & Test of Computers
Year:
2002
Language:
english
File:
PDF, 311 KB
english, 2002