The effects of ionizing radiation on power-MOSFET...

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

The effects of ionizing radiation on power-MOSFET termination structures

Davis, K.R., Schrimpf, R.D., Cellier, F.E., Galloway, K.F., Burton, D.I., Wheatley, C.F.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45411
Date:
January, 1989
File:
PDF, 513 KB
english, 1989
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