Origin of Vt Instabilities in High-$k$Dielectrics...

IEEE Transactions on Device and Materials Reliability 2006 / 06 Vol. 6; Iss. 2

Origin of Vt Instabilities in High-$k$Dielectrics Jahn–Teller Effect or Oxygen Vacancies

Ribes, G., Bruyere, S., Roy, D., Parthasarthy, C., Muller, M., Denais, M., Huard, V., Skotnicki, T., Ghibaudo, G.
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Volume:
6
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2006.877867
Date:
June, 2006
File:
PDF, 500 KB
english, 2006
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