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Extraction Method of Trap Densities in TFTs Combining $C$–$V$ and F-E Methods
Kimura, MutsumiVolume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2012.2192496
Date:
June, 2012
File:
PDF, 211 KB
english, 2012