Test data compression

IEEE Design & Test of Computers 2003 / 03 Vol. 20; Iss. 2

Test data compression

McCluskey, E.J., Burek, D., Koenemann, B., Mitra, S., Patel, J., Rajski, J., Waicukauski, J.
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Volume:
20
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/MDT.2003.1188267
Date:
March, 2003
File:
PDF, 364 KB
english, 2003
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