Volume 20; Issue 2

IEEE Design & Test of Computers

Volume 20; Issue 2
2

Test data compression

McCluskey, E.J., Burek, D., Koenemann, B., Mitra, S., Patel, J., Rajski, J., Waicukauski, J.
Journal:
IEEE Design & Test of Computers
Year:
2003
Language:
english
File:
PDF, 364 KB
english, 2003
4

Electromagnetic signatures as a tool for connectionless test

Salamati, M., Stranneby, D.
Journal:
IEEE Design & Test of Computers
Year:
2003
Language:
english
File:
PDF, 498 KB
english, 2003
7

Embedded boundary scan

Van Treuren, B.G., Miranda, J.M.
Journal:
IEEE Design & Test of Computers
Year:
2003
Language:
english
File:
PDF, 228 KB
english, 2003
8

Compilation for FPGA-based reconfigurable hardware

Cardoso, J.M.P., Neto, H.C.
Journal:
IEEE Design & Test of Computers
Year:
2003
Language:
english
File:
PDF, 297 KB
english, 2003
9

Fast fault simulation for nonlinear analog circuits

Nur Engin,, Kerkhoff, H.G.
Journal:
IEEE Design & Test of Computers
Year:
2003
Language:
english
File:
PDF, 259 KB
english, 2003