A Statistical Evaluation of Random Telegraph Noise of...

IEEE Transactions on Electron Devices 2013 / 10 Vol. 60; Iss. 10

A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

Kuroda, Rihito, Yonezawa, Akihiro, Teramoto, Akinobu, Li, Tsung-Ling, Tochigi, Yasuhisa, Sugawa, Shigetoshi
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2278980
Date:
October, 2013
File:
PDF, 1.66 MB
english, 2013
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