Temperature-Dependence of Off-State Drain Leakage in X-Ray...

IEEE Transactions on Nuclear Science 2006 / 12 Vol. 53; Iss. 6

Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices

Jun, Bongim, Diestelhorst, Ryan M., Bellini, Marco, Espinel, Gustavo, Appaswamy, Aravind, Prakash, A. P. Gnana, Cressler, John D., Chen, Dakai, Schrimpf, Ronald D., Fleetwood, Daniel M., Turowski, Mar
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2006.886230
Date:
December, 2006
File:
PDF, 670 KB
english, 2006
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