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New Layout Arrangement to Improve ESD Robustness of Large-Array High-Voltage nLDMOS
Wen-Yi Chen,, Ming-Dou Ker,Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2037343
Date:
February, 2010
File:
PDF, 420 KB
english, 2010