![](/img/cover-not-exists.png)
Characteristics of Ni/Gd FUSI for NMOS Gate Electrode Applications
Bongmook Lee,, Biswas, N., Novak, S.R., Misra, V.Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.897889
Date:
July, 2007
File:
PDF, 203 KB
english, 2007