Characteristics of Ni/Gd FUSI for NMOS Gate Electrode...

IEEE Electron Device Letters 2007 / 07 Vol. 28; Iss. 7

Characteristics of Ni/Gd FUSI for NMOS Gate Electrode Applications

Bongmook Lee,, Biswas, N., Novak, S.R., Misra, V.
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Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.897889
Date:
July, 2007
File:
PDF, 203 KB
english, 2007
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