Ion-Bombarded and Plasma-Passivated Charge Storage Layer for SONOS-Type Nonvolatile Memory
Liu, Sheng-Hsien, Wu, Chi-Chang, Yang, Wen-Luh, Lin, Yu-Hsien, Chao, Tien-ShengVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2341629
Date:
September, 2014
File:
PDF, 3.15 MB
english, 2014