A Mechanism for Dependence of Refresh Time on Data Pattern...

IEEE Electron Device Letters 2010 / 02 Vol. 31; Iss. 2

A Mechanism for Dependence of Refresh Time on Data Pattern in DRAM

Myoung Jin Lee,, Kun Woo Park,
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2038243
Date:
February, 2010
File:
PDF, 609 KB
english, 2010
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