Experimental Study of Data Retention in Nitride Memories by...

IEEE Electron Device Letters 2007 / 07 Vol. 28; Iss. 7

Experimental Study of Data Retention in Nitride Memories by Temperature and Field Acceleration

Compagnoni, C.M., Spinelli, A.S., Lacaita, A.L.
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Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.898487
Date:
July, 2007
File:
PDF, 113 KB
english, 2007
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