![](/img/cover-not-exists.png)
Experimental Study of Data Retention in Nitride Memories by Temperature and Field Acceleration
Compagnoni, C.M., Spinelli, A.S., Lacaita, A.L.Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.898487
Date:
July, 2007
File:
PDF, 113 KB
english, 2007