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Comparison of nmos and pmos transistor sensitivity to seu in srams by device simulation
K. Castellani-Coulie, B. SagnesVolume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821583
Date:
December, 2003
File:
PDF, 926 KB
english, 2003