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Post irradiation effects (PIE) in integrated circuits (CMOS)
Shaw, D.C., Lowry, L., Barnes, C., Zakharia, M., Agarwal, S., Rax, B.Volume:
38
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.124149
Date:
January, 1991
File:
PDF, 606 KB
english, 1991