Volume 38; Issue 6

IEEE Transactions on Nuclear Science

Volume 38; Issue 6

1

Body tie placement in CMOS/SOI digital circuits for transient radiation environments

Alles, M.L., Kerns, S.E., Massengill, L.W., Clark, J.E., Jones, K.L., Lowther, R.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 567 KB

english, 1991

2

SEU hardened memory cells for a CCSDS Reed-Solomon encoder

Whitaker, S., Canaris, J., Liu, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 784 KB

english, 1991

3

Radiation characteristics of SIPOS and polysilicon resistors

Axness, C.L., Riewe, L., Reber, R.A., Liang, A.Y., Ang, S.S., Brown, W.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 471 KB

english, 1991

4

Electron spin resonance study of E' trapping centers in SIMOX buried oxides

Conley, J.F., Lenahan, P.M., Roitman, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 497 KB

english, 1991

5

Response of advanced bipolar processes to ionizing radiation

Enlow, E.W., Pease, R.L., Combs, W., Schrimpf, R.D., Nowlin, R.N.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 954 KB

english, 1991

6

Determination of SEU parameters of NMOS and CMOS SRAMs

McNulty, P.J., Bearnvais, W.I., Roth, D.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 641 KB

english, 1991

7

Single-event burnout of power bipolar junction transistors

Titus, J.L., Johnson, G.H., Schrimpf, R.D., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 726 KB

english, 1991

8

Charge yield for cobalt-60 and 10-keV X-ray irradiations of MOS devices

Shaneyfelt, M.R., Fleetwood, D.M., Schwank, J.R., Hughes, K.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 732 KB

english, 1991

9

Transient radiation hardness of the CMOSV 1.25 micron technology

Wunsch, T.F., Hash, G.L., Hewlett, F.W., Treece, R.K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 455 KB

english, 1991

10

Response of interface traps during high-temperature anneals (MOSFETs)

Lelis, A.J., Oldham, T.R., DeLancey, W.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 780 KB

english, 1991

11

Measurements of SEU and total dose in geostationary orbit under normal and solar flare conditions

Adams, L., Daly, E.J., Harboe-Sorensen, R., Holmes-Siedle, A.G., Ward, A.K., Bull, R.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 383 KB

english, 1991

12

Correlation between channel hot-electron degradation and radiation-induced interface trapping in N-channel LDD devices

Huang, D.H., King, E.E., Wang, J.J., Ormond, R., Palkuti, L.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 576 KB

english, 1991

13

A monolithic, 2 mu m CMOS constant-fraction discriminator for moderate time resolution systems

Binkley, D.M., Simpson, M.L., Rochelle, J.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 442 KB

english, 1991

14

A Monolithic, 2 μm CMOS Constant-fraction Discriminator For Moderate Time Resolution Systems

Binkley, D.M., Simpson, M.L., Rochelle, J.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 524 KB

english, 1991

15

Comparison Between ML-EM And WLS-CG Algorithms For Spect Image Reconstruction

Tsui, B.M.W., XiDe Zhao,, Frey, E.C., Gullberg, G.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.04 MB

english, 1991

16

Radiation-induced insulator discharge pulses in the CRRES internal discharge monitor satellite experiment

Frederickson, A.R., Mullen, E.G., Brautigam, D.H., Kerns, K.J., Robinson, P.A., Holman, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 759 KB

english, 1991

17

An Innovative Scintillation Process For Correcting, Cooling, And Reducing The Randomness Of Waveforms

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.31 MB

english, 1991

18

High energy proton SEU test results for the commercially available MIPS R3000 microprocessor and R3010 floating point unit

Shaeffer, D.L., Kimbrough, J.R., Denton, S.M., Kaschmitter, J.L., Wilburn, J.W., Davis, R.W., Colella, N.J., Holtkamp, D.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 692 KB

english, 1991

19

Estimating parameter end points for combined environments (semiconductor devices)

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 486 KB

english, 1991

20

Scintillation of bismuth germanate at liquid helium temperatures

Cho, Z.H., Petroff, M.D., Bharat, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 270 KB

english, 1991

21

Detecting And Mitigating Rod Drive Control System Degradation In Westinghouse PWR's

Gunther, W., Sullivan, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 693 KB

english, 1991

22

Total Dose-induced Charge Buildup In Nitrided-oxide MOS Devices

Krantz, R.J., Scarpulla, J., Cable, J.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 878 KB

english, 1991

23

Experimental verification of bremsstrahlung production and dosimetry predictions for 15.5 MeV electrons

Sanford, T.W.L., Beutler, D.E., Halbleib, J.A., Knott, D.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 975 KB

english, 1991

24

Hardness assurance for low-dose space applications (MOS devices)

Fleetwood, D.M., Winokur, P.S., Meisenheimer, T.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 860 KB

english, 1991

25

Fluorescent computer tomography: a model for correction of X-ray absorption

Hogan, J.P., Gonsalves, R.A., Krieger, A.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 935 KB

english, 1991

26

Fluorescent Computer Tomography: A Model For Correction Of X-ray Absorption

Hogan, J.P., Gonsalves, R.A., Krieger, A.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.23 MB

english, 1991

27

Comparison of experimental measurements of power MOSFET SEBs in dynamic and static modes

Calvel, P., Peyrotte, C., Baiget, A., Stassinopoulos, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 507 KB

english, 1991

28

The effect of temperature on single-particle latchup

Johnston, A.H., Hughlock, B.W., Baze, M.P., Plaag, R.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 695 KB

english, 1991

29

Radiation-hardened phototransistor

Matzen, W.T., Hawthorne, R.A., Kilian, W.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 525 KB

english, 1991

30

Radiation characterization of the ADSP2100A digital signal processor

Kinnison, J.D., Maurer, R.H., Carkhuff, B.G., Conde, R.F., Buchner, S.P., Kang, K., Stapor, W.J., Campbell, A.B., Herlich, G.A., Moore, H.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 488 KB

english, 1991

31

Nuclear and damage effects in Si produced by irradiations with medium energy protons

Alurralde, M., Victoria, M., Caro, A., Gavillet, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 451 KB

english, 1991

32

Techniques for minimizing space proton damage in scientific charge coupled devices

Holland, A., Holmes-Siedle, A., Johlander, B., Adams, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 803 KB

english, 1991

33

Modeling of radiation-induced leakage currents in CMOS/SOI devices

Rios, R., Smeltzer, R.K., Garcia, G.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 508 KB

english, 1991

34

Bench-level characterization of a CMOS standard-cell D-latch using alpha-particle sensitive test circuits

Blaes, B.R., Soli, G.A., Buehler, M.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 601 KB

english, 1991

35

Si-SiO/sub 2/ interface state generation during X-ray irradiation and during post-irradiation exposure to a hydrogen ambient (MOSFET)

Mrstik, B.J., Rendell, R.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 954 KB

english, 1991

36

Test of SEU algorithms against preliminary CRRES satellite data

McNulty, P.J., Beauvais, W.J., Abdel-Kader, W.G., El-Teleaty, S.S., Mullen, E.G., Ray, K.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 422 KB

english, 1991

37

A spacecraft charging study on the SCEX 3 rocket

Mullen, E.G., Gussenhoven, M.S., Hardy, D.A., Murphy, G.P., Lloyd, J.W.F., Slutter, W., Malcolm, P., Kellogg, P.J., Monson, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 671 KB

english, 1991

38

Dosimetry considerations for the high-energy photon/electron environment of HERMES III: implications for experiments and modeling

Beutler, D.E., Halbleib, J.A., Sanford, T.W.L., Fehl, D.L., Knott, D.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.01 MB

english, 1991

39

Quantitative comparison of single event upsets induced by protons and neutrons (RAM devices)

Normand, E., Stapor, W.J., McNulty, P., Abdel-Kader, W.G., Yaktieen, M.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 603 KB

english, 1991

40

Electrostatic discharge induced thermo-optical degradation of optical solar reflectors (OSRs)

Bogorad, A., Bowman, C., Lloyd, T., Loman, J., Armenti, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 459 KB

english, 1991

41

Charge collection mechanisms in MOS/SOI transistors irradiated by energetic heavy ions

Musseau, O., Leray, J.L., Ferlet, V., Umbert, A., Coic, Y.M., Hesto, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 691 KB

english, 1991

42

Dose variation during solar minimum

Gussenhoven, M.S., Mullen, E.G., Brautigam, D.H., Holeman, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 592 KB

english, 1991

43

Radiation effects in high temperature superconducting films and devices for the NRL high temperature superconductivity space experiment

Weaver, B.D., Jackson, E.M., Summers, G.P., Chrisey, D.B., Horwitz, J.S., Pond, J.M., Newman, H.S., Burke, E.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 471 KB

english, 1991

44

Scintillation Of Bismuth Germanate At Liquid Helium Temperatures

Cho, Z.H., Petroff, M.D., Bharat, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 355 KB

english, 1991

45

Post irradiation effects (PIE) in integrated circuits (CMOS)

Shaw, D.C., Lowry, L., Barnes, C., Zakharia, M., Agarwal, S., Rax, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 606 KB

english, 1991

46

Energy dependence of electron damage and displacement threshold energy in 6H silicon carbide

Barry, A.L., Lehmann, B., Fritsch, D., Braunig, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 523 KB

english, 1991

47

Radiation damage assessment of Nb tunnel junction devices

King, S.E., Magno, R., Maisch, W.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 454 KB

english, 1991

48

CRRES microelectronic test chip

Lin, Y.-S., Buehler, M.G., Ray, K.P., Sokoloski, M.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 486 KB

english, 1991

49

Predicting worst-case charge buildup in power-device field oxides

Kosier, S.L., Schrimpf, R.D., Galloway, K.F., Cellier, F.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 613 KB

english, 1991

50

Effects of ionizing radiation on the noise properties of DMOS power transistors

Babcock, J.A., Titus, J.L., Schrimpf, R.D., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 482 KB

english, 1991

51

Neutron damage equivalence in GaAs

Griffin, P.J., Kelly, J.G., Luera, T.F., Barry, A.L., Lazo, M.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 737 KB

english, 1991

52

SEU flight data from the CRRES MEP

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 698 KB

english, 1991

53

Charge collection in GaAs MESFETs and MODFETs

Buchner, S., Kang, K., Tu, D.W., Knudson, A.R., Campbell, A.B., McMorrow, D., Srinivas, V., Chen, Y.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 668 KB

english, 1991

54

Alteration in the superconducting properties of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/ crystals due to proton irradiation

Lombardo, L., Kapitulnik, A., Leone, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 486 KB

english, 1991

55

Gate-charge measurements for irradiated n-channel DMOS power transistors

Yiin, A.J., Schrimpf, R.D., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 558 KB

english, 1991

56

Freeze-out characterization of radiation hardened N/sup +/ polysilicon gate CMOS transistors

Pantelakis, D.C., Hemmenway, D.F., van Vonno, N.W., Sanders, T.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 758 KB

english, 1991

57

Transient SEUs in a fiber optic system for space applications

LaBel, K., Stassinopoulos, E.G., Brucker, G.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 397 KB

english, 1991

58

Operation of commercial R3000 processors in the Low Earth Orbit (LEO) space environment

Kaschmitter, J.L., Shaeffer, D.L., Colella, N.J., McKnett, C.L., Coakley, P.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 639 KB

english, 1991

59

Measured microdosimetric spectra of energetic ion beams of Fe, Ar, Ne, and C: limitations of LET distributions and quality factors in space research and radiation effects

Dicello, J.F., Wasiolek, M., Zaider, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 651 KB

english, 1991

60

Space radiation effects in InP solar cells

Walters, R.J., Messenger, S.R., Summers, G.P., Burke, E.A., Keavney, C.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 567 KB

english, 1991

61

Dosimetry Considerations For The High-energy Photon/electron Environment Of Hermes III: Implications For Experiments And Modeling

Beutler, D.E., Halbleib, J.A., Sanford, T.T.L., Fehl, D.L., Knott, D.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.19 MB

english, 1991

62

Dosimetry in linac electron-beam environments (microelectronic packages)

Beutler, D.E., Lorence, L.J., Brown, D.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 813 KB

english, 1991

63

A 1 K shadow RAM for circumvention applications

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 538 KB

english, 1991

64

On the suitability of non-hardened high density SRAMs for space applications

Koga, R., Crain, W.R., Crawford, K.B., Lau, D.D., Pinkerton, S.D., Yi, B.K., Chitty, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 564 KB

english, 1991

65

Transient radiation response of VLSI circuits: shadowing effects and pulse widths dependence in laser measurements

Jonsson, M., Mattsson, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 510 KB

english, 1991

66

Effects of switched gate bias on radiation-induced interface trap formation (MOS transistors)

Saks, N.S., Brown, D.B., Rendell, R.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1013 KB

english, 1991

67

Radiation environment measurements and single event upset observations in sun-synchronous orbit

Dyer, C.S., Sims, A.J., Farren, J., Stephen, J., Underwood, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 539 KB

english, 1991

68

AC-bias annealing effects on radiation-induced interface traps (MOS transistors)

Kato, M., Watanabe, K., Okabe, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 692 KB

english, 1991

69

Detecting and mitigating rod drive control system degradation in Westinghouse PWRs

Gunther, W., Sullivan, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 568 KB

english, 1991

70

Comparison between ML-EM and WLS-CG algorithms for SPECT image reconstruction

Tsui, B.M.W., Zhao, X., Frey, E.C., Gullberg, G.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 749 KB

english, 1991

71

28th IEEE Annual International Nuclear and Space Radiation Effects Conference (NSREC '91)

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 416 KB

english, 1991

72

SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor

Sexton, F.W., Corbett, W.T., Treece, R.K., Hass, K.J., Hughes, K.L., Axness, C.L., Hash, G.L., Shaneyfelt, M.R., Wunsch, T.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 822 KB

english, 1991

73

The photoconductivity spectrum of electron and neutron irradiated n lightly doped GaAs

Khanna, S.M., Carlone, C., Halle, S., Parenteau, M., Beliveau, A., Aktik, C., Gerdes, J.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 668 KB

english, 1991

74

Effect of bias on thermally stimulated current (TSC) in irradiated MOS devices

Fleetwood, D.M., Reber, R.A., Winokur, P.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.26 MB

english, 1991

75

Update on parts SEE suspectibility from heavy ions

Nichols, D.K., Smith, L.S., Schwartz, H.R., Soli, G., Watson, K., Koga, R., Crain, W.R., Crawford, K.B., Hansel, S.J., Lau, D.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 695 KB

english, 1991

76

Thermal annealing of trapped holes in SIMOX buried oxides

Pennise, C.A., Boesch, H.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 583 KB

english, 1991

77

Wafer-level radiation testing for hardness assurance

Shaneyfelt, M.R., Hughes, K.L., Schwank, J.R., Sexton, F.W., Fleetwood, D.M., Winokur, P.S., Enlow, E.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 713 KB

english, 1991

78

SEU-hardened resistive-load static RAMs

Massengill, L.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 611 KB

english, 1991

79

Use of silicon bipolar transistors as sensors for neutron energy spectra determinations

Kelly, J.G., Griffin, P.J., Luera, T.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 622 KB

english, 1991

80

Comparison of experimental charge collection waveforms with PISCES calculations

Knudson, A.R., Campbell, A.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 467 KB

english, 1991

81

Total dose-induced charge buildup in nitrided-oxide MOS devices

Krantz, R.J., Scarpulla, J., Cable, J.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 742 KB

english, 1991

82

The role of secondary defects in the loss of energy resolution of fast-neutron-irradiated HPGe gamma-ray detectors

Fourches, N., Huck, A., Walter, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 787 KB

english, 1991

83

Characterization and modeling of neutron induced transient response changes in Si:As IBC detectors

Clement, R.E., Boisvert, J.C., Sullivan, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 461 KB

english, 1991

84

Ionizing space radiation effects on surface acoustic wave resonators

Stapor, W.J., Hines, J.H., Wilson, D.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 525 KB

english, 1991

85

Random telegraph signals in small MOSFETs after X-ray irradiation

Muto, H., Tsai, M.-H., Ma, T.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 673 KB

english, 1991

86

Back channel uniformity of thin SIMOX wafers

Liu, S.T., Allen, L.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 490 KB

english, 1991

87

Upset due to a single particle caused propagated transient in a bulk CMOS microprocessor

Leavy, J.F., Hoffmann, L.F., Shovan, R.W., Johnson, M.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 489 KB

english, 1991

88

1/f noise in n- and p-channel MOS devices through irradiation and annealing

Meisenheimer, T.L., Fleetwood, D.M., Shaneyfelt, M.R., Riewe, L.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 643 KB

english, 1991

89

Spacecraft charging thresholds in single and double Maxwellian space environments

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 483 KB

english, 1991

90

Ion induced charge collection in GaAs MESFETs and its effect on SEU vulnerability

Hughlock, B., Williams, T., Johnston, A., Plaag, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 656 KB

english, 1991

91

The Role Of Secondary Defects In The Loss Of Energy Resolution Of Fast-neutron-irradiated HPGE Gamma-ray Detectors

Fourches, N., Huck, A., Walter, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 915 KB

english, 1991

92

A bias voltage dependence of trapped hole annealing and its measurement technique (MOS capacitor)

Kuboyama, S., Goka, T., Tamura, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 463 KB

english, 1991

93

An innovative scintillation process for correcting, cooling, and reducing the randomness of waveforms

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 1.07 MB

english, 1991

94

Lateral distribution of radiation-induced damage in MOSFETs

Chen, W., Balasinski, A., Ma, T.-P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 511 KB

english, 1991

95

Discharges triggered on and by electron bombarded dielectrics

Levy, L., Reulet, R., Siguier, J.M., Sarrail, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 521 KB

english, 1991

96

Neutron irradiation effects on PZT thin films for nonvolatile-memory applications

Moore, R.A., Benedetto, J.M., McGarrity, J.M., McLean, F.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 459 KB

english, 1991

97

Radiation evaluation of commercial ferroelectric nonvolatile memories

Benedetto, J.M., De Lancey, W.M., Oldham, T.R., McGarrity, J.M., Tipton, C.W., Brassington, M., Fisch, D.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 428 KB

english, 1991

98

Physical basis for nondestructive tests of MOS radiation hardness

Scofield, J.H., Fleetwood, D.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 995 KB

english, 1991

99

Guidelines for predicting single-event upsets in neutron environments (RAM devices)

Letaw, J.R., Normand, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 549 KB

english, 1991

100

The on-orbit measurements of single event phenomena by ETA-V spacecraft

Goka, T., Kuboyama, S., Shimano, Y., Kawanishi, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 459 KB

english, 1991

101

SIMOX with epitaxial silicon: point defects and positive charge

Zvanut, M.E., Stahlbush, R.E., Carlos, W.E., Hughes, H.L., Lawrence, R.K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 579 KB

english, 1991

102

Proton and heavy ion upsets in GaAs MESFET devices

Weatherfold, T.R., Tran, L., Stapor, W.J., Petersen, E.L., Langworthy, J.B., McMorrow, D., Abdel-Kader, W.G., McNulty, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 562 KB

english, 1991

103

Preliminary comparison of dose measurements on CRRES to NASA model predictions

Gussenhoven, M.S., Mullen, E.G., Brautigam, D.H., Holeman, E., Jordan, C., Hanser, F., Dichter, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 678 KB

english, 1991

104

Hole transport in SiO/sub 2/ and reoxidized nitrided SiO/sub 2/ gate insulators at low temperature (FETs)

Boesch, H.E., Dunn, G.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 576 KB

english, 1991

105

A comparison of methods for simulating low dose-rate gamma ray testing of MOS devices

Jenkins, W.C., Martin, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 612 KB

english, 1991

106

Charge buildup at high dose and low fields in SIMOX buried oxides

Boesch, H.E., Taylor, T.L., Brown, G.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 593 KB

english, 1991

107

Radiation characteristics of epitaxial CaF/sub 2/ on silicon

Nishioka, Y., Cho, C.-C., Summerfelt, S.R., Gnade, B.E., Brown, G.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 537 KB

english, 1991

108

Production and measurement of flash X-ray dose rates in excess of 10/sup 13/ RAD (CaF/sub 2/)/s

Sanford, T.W.L., Halbleib, J.A., Beutler, D.E., McAtee, W.H., Mock, R.C., Knott, D.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 615 KB

english, 1991

109

1991 Index - IEEE Transactions on Nuclear Science Vol. 38

Journal:

IEEE Transactions on Nuclear Science

Year:

1991

Language:

english

File:

PDF, 4.47 MB

english, 1991

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