A cautionary tale of soft errors induced by SRAM packaging...

IEEE Transactions on Device and Materials Reliability 2005 / 09 Vol. 5; Iss. 3

A cautionary tale of soft errors induced by SRAM packaging materials

Wilkinson, J., Hareland, S.
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Volume:
5
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2005.855825
Date:
September, 2005
File:
PDF, 252 KB
english, 2005
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