Radiation hardness of czochralski silicon studied by 10-mev...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Radiation hardness of czochralski silicon studied by 10-mev and 20-mev protons

Tuominen, E., Harkonen, J., Tuovinen, E., Lassila-Perini, K., Luukka, P., Mehtala, P., Nummela, S., Nysten, J., Zibellini, A., Li, Z., Heikkila, P., Ovchinnikov, V., Yli-Koski, M., Laitinen, P., Piroj
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821405
Date:
December, 2003
File:
PDF, 396 KB
english, 2003
Conversion to is in progress
Conversion to is failed