![](/img/cover-not-exists.png)
Electron traps in B+-implanted SiO2
M. Offenberg, T. Johannson, M. Aslam, P. BalkVolume:
129
Year:
1985
Language:
english
Pages:
5
DOI:
10.1016/0378-4363(85)90577-7
File:
PDF, 285 KB
english, 1985