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New observations on the electrical properties and instabilities of pure and metal doped SiO2 films
K.V. Krishna, J.J. Delima, F.C. Eze, A.E. OwenVolume:
129
Year:
1985
Language:
english
Pages:
4
DOI:
10.1016/0378-4363(85)90578-9
File:
PDF, 199 KB
english, 1985