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Charge loss experiments in surface channel CCD's explained by the McWhorter interface states model
R.G.M. Penning de Vries, H. WallingaVolume:
129
Year:
1985
Language:
english
Pages:
5
DOI:
10.1016/0378-4363(85)90590-x
File:
PDF, 273 KB
english, 1985