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EBIC profiling of bevelled samples: A precise method to determine the position of p-n junctions and doping gradients
Hans Wolfgang Marten, Olaf HildebrandVolume:
129
Year:
1985
Language:
english
Pages:
6
DOI:
10.1016/0378-4363(85)90591-1
File:
PDF, 303 KB
english, 1985