Multifunction Behavior of a Vertical MOSFET With Trench Body Structure and New Erase Mechanism for Use in 1T-DRAM
Lin, Jyi-Tsong, Lin, Po-HsiehVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2336533
Date:
September, 2014
File:
PDF, 2.22 MB
english, 2014