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Dielectrics Subjected to PBTI Stress
Heh, Dawei, Young, Chadwin D., Bersuker, GennadiVolume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.914088
Date:
February, 2008
File:
PDF, 224 KB
english, 2008