Hot carrier analysis in low-temperature poly-Si thin-film...

IEEE Electron Device Letters 2003 / 04 Vol. 24; Iss. 4

Hot carrier analysis in low-temperature poly-Si thin-film transistors using pico-second time-resolved emission microscope

Uraoka, Y., Hirai, N., Yano, H., Hatayama, T., Fuyuki, T.
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Volume:
24
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2003.810877
Date:
April, 2003
File:
PDF, 224 KB
english, 2003
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