A Physical Model for Post-Breakdown Digital Gate Current...

IEEE Electron Device Letters 2010 / 09 Vol. 31; Iss. 9

A Physical Model for Post-Breakdown Digital Gate Current Noise

Padovani, Andrea, Morassi, Luca, Raghavan, Nagarajan, Larcher, Luca, Wenhu, Wenhu, Pey, Kin Leong, Bersuker, Gennadi
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2055827
Date:
September, 2010
File:
PDF, 298 KB
english, 2010
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