A design-for-verification technique for functional pattern...

IEEE Design & Test of Computers 2003 / 03 Vol. 20; Iss. 2

A design-for-verification technique for functional pattern reduction

Chien-Nan Jimmy Liu,, I-Ling Chen,, Jing-Yang Jou,
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Volume:
20
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2003.1188262
Date:
March, 2003
File:
PDF, 319 KB
english, 2003
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