![](/img/cover-not-exists.png)
Proton tolerance of multiple-threshold voltage and multiple-breakdown voltage cmos device design points in a 0.18 μm system-on-a-chip cmos technology
Ying Li,, Cressler, J.D., Yuan Lu,, Jun Pan,, Guofu Niu,, Reed, R.A., Marshall, P.W., Polar, C., Palmer, M.J., Joseph, A.J.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821800
Date:
December, 2003
File:
PDF, 341 KB
english, 2003