Proton tolerance of multiple-threshold voltage and...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Proton tolerance of multiple-threshold voltage and multiple-breakdown voltage cmos device design points in a 0.18 μm system-on-a-chip cmos technology

Ying Li,, Cressler, J.D., Yuan Lu,, Jun Pan,, Guofu Niu,, Reed, R.A., Marshall, P.W., Polar, C., Palmer, M.J., Joseph, A.J.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821800
Date:
December, 2003
File:
PDF, 341 KB
english, 2003
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