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Demonstration of Addressable Organic Resistive Memory Utilizing a PC-Interface Memory Cell Tester
Cho, Byungjin, Song, Sunghoon, Ji, Yongsung, Choi, Ho-Gil, Ko, Heung Cho, Lee, Jae-Suk, Jung, Gun-Young, Lee, TakheeVolume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2226231
Date:
January, 2013
File:
PDF, 448 KB
english, 2013