Bias dependence of fd transistor response to total dose...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Bias dependence of fd transistor response to total dose irradiation

Flament, O., Torres, A., Ferlet-Cavrois, V.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.822594
Date:
December, 2003
File:
PDF, 395 KB
english, 2003
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