Impact of data cache memory on the single event...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Impact of data cache memory on the single event upset-induced error rate of microprocessors

Faure, F., Velazco, R., Violante, M., Rebaudengo, M., Reorda, M.S.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821824
Date:
December, 2003
File:
PDF, 301 KB
english, 2003
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