Characterization method for ionizing radiation degradation...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

Characterization method for ionizing radiation degradation in power MOSFETs

de la Bardonnie, M., Maouad, A., Mialhe, P., Elmazria, O., Hoffmann, A., Lepley, B., Charles, J.-P.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488758
Date:
January, 1995
File:
PDF, 600 KB
english, 1995
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