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The generation lifetime damage factor and its variance in silicon
Dale, C.J., Marshall, P.W., Burke, E.A., Summers, G.P., Bender, G.E.Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45381
Date:
January, 1989
File:
PDF, 884 KB
english, 1989