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Determining the impact resistance of electrically conductive adhesives using a falling wedge test
Shuangyan Xu,, Dillard, D.A.Volume:
26
Language:
english
Journal:
IEEE Transactions on Components and Packaging Technologies
DOI:
10.1109/tcapt.2003.817646
Date:
September, 2003
File:
PDF, 981 KB
english, 2003