A Guideline for the Optimum Fin Width Considering...

IEEE Electron Device Letters 2011 / 09 Vol. 32; Iss. 9

A Guideline for the Optimum Fin Width Considering Hot-Carrier and NBTI Degradation in MuGFETs

Lee, Dong Hun, Lee, Seung Min, Yu, Chong Gun, Park, Jong Tae
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Volume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2011.2159474
Date:
September, 2011
File:
PDF, 319 KB
english, 2011
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