Modeling single-event effects in a complex digital device

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Modeling single-event effects in a complex digital device

Clark, K.A., Ross, A.A., Loomis, H.H., Weatherford, T.R., Fouts, D.J., Buchner, S.P., McMorrow, D.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821793
Date:
December, 2003
File:
PDF, 885 KB
english, 2003
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