An optimized package test methodology for testing FRAM®...

Integrated Ferroelectrics 1999 / 10 Vol. 26; Iss. 1-4

An optimized package test methodology for testing FRAM® memories

Mitra, Sanjay, Humes, James
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Volume:
26
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589908215630
Date:
October, 1999
File:
PDF, 601 KB
english, 1999
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