Volume 26; Issue 1-4

Integrated Ferroelectrics

Volume 26; Issue 1-4
1

Crystallization behavior of alkoxy- derived SrBi 2 Ta 2 O 9 thin films on Pt-passivated Si

Year:
1999
Language:
english
File:
PDF, 672 KB
english, 1999
2

Studies on PZT precursor solutions

Year:
1999
Language:
english
File:
PDF, 296 KB
english, 1999
10

An optimized package test methodology for testing FRAM® memories

Year:
1999
Language:
english
File:
PDF, 601 KB
english, 1999
11

Process engineering issues of CSD-based thin-film multi-level ceramic capacitors

Year:
1999
Language:
english
File:
PDF, 996 KB
english, 1999
13

Processing of multilayer PZT coatings for device purposes

Year:
1999
Language:
english
File:
PDF, 691 KB
english, 1999
14

Epitaxial growth and structural properties of conductive RuO 2 thin films

Year:
1999
Language:
english
File:
PDF, 1.04 MB
english, 1999
16

Guest editorial

Year:
1999
Language:
english
File:
PDF, 230 KB
english, 1999
18

Comparison of CSD and sputtered PZT with iridium electrodes

Year:
1999
Language:
english
File:
PDF, 420 KB
english, 1999
29

SBTN thin film capacitors prepared by RF-magnetron sputtering

Year:
1999
Language:
english
File:
PDF, 420 KB
english, 1999
30

New low temperature preparation of ferroelectric Bi 4 Ti 3 O 12 thin films by MOCVD method

Year:
1999
Language:
english
File:
PDF, 447 KB
english, 1999