Time-Domain Component Analysis of Heavy-Ion-Induced...

IEEE Transactions on Nuclear Science 2006 / 12 Vol. 53; Iss. 6

Time-Domain Component Analysis of Heavy-Ion-Induced Transient Currents in Fully-Depleted SOI MOSFETs

Kobayashi, Daisuke, Aimi, Masahiro, Saito, Hirobumi, Hirose, Kazuyuki
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2006.886234
Date:
December, 2006
File:
PDF, 421 KB
english, 2006
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