Comparative secondary ion mass spectroscopy analysis of...

Semiconductor Science and Technology 2004 / 02 Vol. 19; Iss. 2

Comparative secondary ion mass spectroscopy analysis of solar cell structures grown by pulsed laser ablation and ion sputtering

Godines, J A, Villegas, A, Kudriavtsev, Yu, Asomoza, R, Morales-Acevedo, A, Escamilla, A, Arriaga, G, Hernández-Contreras, H, Contreras-Puente, G, Vidal, J, Chavarría, M, Fragoso-Soriano, R
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Volume:
19
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/19/2/015
Date:
February, 2004
File:
PDF, 317 KB
english, 2004
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