IEEE 1149.6: a boundary-scan standard for advanced digital networks
Eklow, B., Parker, K.P., Barnhart, C.F.Volume:
20
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2003.1232259
Date:
September, 2003
File:
PDF, 265 KB
english, 2003