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The Effect of Re-Convergence on SER Estimation in Combinational Circuits
Biwei, Liu, Shuming, Chen, Bin, Liang, Zheng, Liu, Zhenyu, ZhaoVolume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2034147
Date:
December, 2009
File:
PDF, 464 KB
english, 2009