Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors
Chen, Min, Reddy, Vijay, Krishnan, Srikanth, Srinivasan, Venkatesh, Cao, YuVolume:
29
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2012.2210381
Date:
October, 2012
File:
PDF, 902 KB
english, 2012