IEEE Design & Test of Computers

1

Improving IC Security Against Trojan Attacks Through Integration of Security Monitors

Narasimhan, Seetharam, Yueh, Wen, Wang, Xinmu, Mukhopadhyay, Saibal, Bhunia, Swarup

Journal:

Year:

2012

Language:

english

File:

PDF, 984 KB

english, 2012

2

Two Approaches to Handling Late Essential/Necessary Patent Claims Against Standards

Krolikoski, Stan

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 88 KB

english, 2012

3

Defect Oriented Testing for Analog/Mixed-Signal Designs

Kruseman, Bram, Tasic, Bratislav, Hora, Camelia, Dohmen, Jos, Hashempour, Hamidreza, van Beurden, Maikel, Xing, Yizi

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 448 KB

english, 2012

4

Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost

Ishida, Masahiro, Ichiyama, Kiyotaka, Fujibe, Tasuku, Watanabe, Daisuke, Kawabata, Masayuki

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 1003 KB

english, 2012

5

Process and Reliability Sensors for Nanoscale CMOS

Keane, John P., Kim, Chris H., Liu, Qunzeng, Sapatnekar, Sachin S.

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 849 KB

english, 2012

6

Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan

Sunter, Stephen, Roy, Aubin

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 529 KB

english, 2012

7

Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors

Chen, Min, Reddy, Vijay, Krishnan, Srikanth, Srinivasan, Venkatesh, Cao, Yu

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 902 KB

english, 2012

8

SerDes Interoperability and Optimization

Kamm, Matthias, Jun, Hongshin, Boluna, Luis

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 744 KB

english, 2012

9

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection

Pachito, Jackson, Martins, Celestino V., Jacinto, Bruno, Semiao, Jorge, Vazquez, Julio C., Champac, Victor, Santos, Marcelino B., Teixeira, Isabel C., Teixeira, Joao Paulo

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 575 KB

english, 2012

10

Physically-Aware Analysis of Systematic Defects in Integrated Circuits

Tam, Wing Chiu, Blanton, R. D.

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 1.53 MB

english, 2012

11

Call for papers: Special Issue on Variability and Aging

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 53 KB

english, 2012

12

Biologically Inspired Robust Tera-Device Processors

Nicolaidis, Michael

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 135 KB

english, 2012

13

CEDA Currents

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 111 KB

english, 2012

14

Guest Editors' introduction: On-chip structures for smarter silicon

Tehranipoor, Mohammad, Winemberg, LeRoy

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 57 KB

english, 2012

15

Test Technology TC Newsletter

Theocharides, Theo

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 74 KB

english, 2012

16

ITC - Where fantasy becomes reality

Davidson, Scott

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 69 KB

english, 2012

17

Towards smarter silicon and data-driven design of integrated circuits [From the EIC]

Chakrabarty, Krishnendu

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 99 KB

english, 2012

18

[Front cover]

Journal:

IEEE Design & Test of Computers

Year:

2012

File:

PDF, 1.44 MB

2012

19

IEEE Xplore Digital Library

Journal:

IEEE Design & Test of Computers

Year:

2012

File:

PDF, 1.59 MB

2012

20

IEEE Digital Library

Journal:

IEEE Design & Test of Computers

Year:

2012

File:

PDF, 1.33 MB

2012

21

Technology insight on demand on IEEE.tv [advertisement]

Journal:

IEEE Design & Test of Computers

Year:

2012

File:

PDF, 1.05 MB

2012

22