Dynamic fault dictionaries and two-stage fault isolation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 1998 / 03 Vol. 6; Iss. 1

Dynamic fault dictionaries and two-stage fault isolation

Ryan, P.G., Kent Fuchs, W.
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Volume:
6
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/92.661261
Date:
March, 1998
File:
PDF, 116 KB
english, 1998
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