Meyer–Neldel Rule for Effective Channel Mobility in the...

IEEE Electron Device Letters 2013 / 05 Vol. 34; Iss. 5

Meyer–Neldel Rule for Effective Channel Mobility in the Subthreshold Region of Poly-Si Thin-Film Transistors

Zhou, Xiaoliang, Wang, Mingxiang
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2251601
Date:
May, 2013
File:
PDF, 531 KB
english, 2013
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